INTRODUCTION |
BXM-M263 is an new generation high definition EL Tester. It is a testing machine by applying electroluminescent principle for the detection of internal defects in solar module. This equipment gives the opportunity to analysis the EL image to control the choice of material better and to detect the problems coming from the process of solar module production. When test the solar module, the module must be faced down with the long side of the rectangular shape module to the forward during transfer. |
BENEFIT |
1. This product has been specially researched and developed to meet new national standards for EL detection: Detection standard of new national standards is 0.5mm/pixel, and this product has reached 0.4 - 0.3mm/pixel. |
2. High Definition: Image will be formed through 4 cameras upward perpendicular incidence and solar module moves three times, equivalent to the use of 12 cameras at the same time to take pictures, the imaging effect has reached the level of the solar cell. Pixels of a single camera has upgraded to 230W from 140W. |
3.Detection model: It allows the high-low-current detection. In order to meet detection demands of different customers, three modes of detection are available in the software: high-current detection, low-current detection and simultaneous detection of high current and low current. |
4. Homing function: The equipment has around homing function of the solar module, ensure the stability and reliability of the three power up. |
5.Automatic Identification:
1. Automatic identification of major defects can be realized for mono-crystal high-current pictures.
2. Auxiliary diagnosis of major defects can be realized for poly-crystal high-current pictures.
3. Major defects include: micro-crack, break gridline, black edge, black core and others.
4. For low-current pictures, calibration can be carried out on solar cell according to gray scale and automatic calibration for cold solder joint and relatively low-efficiency solar cell. |
Specifications: |
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High-current detection shall be less than 30S, and high-low-current simultaneous detection shall be less than 33S. |
Types of defects: |
High current: Micro-crack, fragment, low-efficiency cell, sintered reticulation, material defect,break gridline.
Low-current: cold solder joint and relatively low-efficiency solar cell. |
Shooting Mode: |
Image will be formed through 4 cameras upward perpendicular incidence and solar module moves three times |
Imaging system: |
SONY chip camera , resolution ratio 1920×1200(230W)
Total resolution ratio 4×1920×1200×3W(2760W) |
Loading system: |
Loading and unloading system with the machine. |
Display: |
4K display – image resolution |
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2100x1300mm |
High-current detection (A): |
8~10A |
Low-current detection (A): |
0.8~1A |
Image processing : |
EL image display: local enlargement, bar-code
Picture processing: gain, gray scale, clipping, rotation.
Inquiry: barcode inquiry, date inquiry
Function selection: normal detection and low-current detection
Automatic identification
Low-current automatic gray-scale
Others: user defined |
Dimension: |
2630×2400×1400MM |
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Detection mode: It is used for normal detection of production line
Running mode: Not to carry out EL testing and used for assembly-line
Debugging mode: to carry out independent control of each component of the equipment and used for debugging and maintenance. |